LINE-SHAPE OF RESONANCES RECORDED IN SELECTIVE REFLECTION - INFLUENCEOF AN ANTIREFLECTION COATING

The theory of selective reflection from the boundary of rarefied atomi c vapor and a transparent dielectric medium covered by an antireflecti on coating is developed. The line shape of the selective reflection si gnal is shown to depend strongly on the refractive indices of the mate rials of the antireflection coating as well as on its thickness. Condi tions are derived under which the line shape depends only on the imagi nary part of the admittance of the vapor at the boundary. As an applic ation, Doppler-free resonances, recorded in selective reflection are d iscussed.