ZnGa2O4 and Zn1-xMnxGa2O4 were investigated as potential low voltage c
athodoluminescence phosphors for use in vacuum fluorescent displays. A
low-voltage cathodoluminescence spectrophotometer was developed for p
hosphor characterization. Brightness was measured as a function of ano
de voltage (10 to 300 V). The effects of activator concentration, phos
phor layer thickness, deposition process, and internal pressure were e
xamined. The stability of these oxide phosphors in high vacuum and abs
ence of corrosive gas emission under electron bombardment, offer advan
tages over commonly used sulfide phosphors.