THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FORPARTICLE-SHAPE CHARACTERIZATION

Authors
HEFFELS CMG HEITZMANN D HIRLEMAN ED SCARLETT B
Citation
Cmg. Heffels et al., THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FORPARTICLE-SHAPE CHARACTERIZATION, Particle & particle systems characterization, 11(3), 1994, pp. 194-199
Citations number
11
Categorie Soggetti
Materials Science, Characterization & Testing","Engineering, Chemical
Journal title
Particle & particle systems characterization → ACNP
ISSN journal
09340866
Volume
11
Issue
3
Year of publication
1994
Pages
194 - 199
Database
ISI
SICI code
0934-0866(1994)11:3<194:TUOAIV>2.0.ZU;2-Q
Abstract
Forward light scattering is a well established technique for measuring particle size distributions. The light intensity fluctuations which c an be observed in the diffraction plane of the instrument can be used to stabilize the inversion process [1]. Particle shape information is also present in these fluctuations. It is shown that an azimuthal-type of detector can be used to extract this information from the statisti cal correlations of the detector signals.