Cmg. Heffels et al., THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FORPARTICLE-SHAPE CHARACTERIZATION, Particle & particle systems characterization, 11(3), 1994, pp. 194-199
Citations number
11
Categorie Soggetti
Materials Science, Characterization & Testing","Engineering, Chemical
Forward light scattering is a well established technique for measuring
particle size distributions. The light intensity fluctuations which c
an be observed in the diffraction plane of the instrument can be used
to stabilize the inversion process [1]. Particle shape information is
also present in these fluctuations. It is shown that an azimuthal-type
of detector can be used to extract this information from the statisti
cal correlations of the detector signals.