NEW MOIRE INTERFEROMETRY FOR MEASURING 3-DIMENSIONAL DISPLACEMENTS

Authors
WANG YY CHIANG FP
Citation
Yy. Wang et Fp. Chiang, NEW MOIRE INTERFEROMETRY FOR MEASURING 3-DIMENSIONAL DISPLACEMENTS, Optical engineering, 33(8), 1994, pp. 2654-2658
Citations number
8
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
33
Issue
8
Year of publication
1994
Pages
2654 - 2658
Database
ISI
SICI code
0091-3286(1994)33:8<2654:NMIFM3>2.0.ZU;2-3
Abstract
A new modified moire interferometry for measuring u, v, and w displace ment fields is proposed. The method is actually integrated with in-pla ne moire interferometry and a new interferometry that can attain out-o f-plane displacements. The sensitivity of the measurement of the out-o f-plane displacement is as high as a half-wavelength of the illuminati ng light. The measured in-plane and out-of-plane displacement fields a re mutually independent and definitely defined.