To cope with the increasing number of design-for-testability technique
s, designers require CAD tools to help organize, evaluate, and select
test techniques that satisfy design objectives. The authors propose a
fuzzy decision-making approach for the selection of test methodologies
. To show how a single decision model deals with several selection pro
blems encountered in VLSI design, they apply the model to the selectio
n of a DFT technique for a programmable logic array.