K. Schimpf et al., ELECTRIC-DIPOLE SPIN-RESONANCE OF GRAIN-BOUNDARIES IN MULTICRYSTALLINE SILICON, Physica status solidi. a, Applied research, 144(1), 1994, pp. 195-201
An electrically induced electron paramagnetic resonance signal is repo
rted, which is observed at grain boundaries of multicrystalline solar
silicon. The characteristic properties are a phase shift of 180-degree
s relative to the P0 signal and a superlinear increase of the intensit
y with microwave power. These properties can be qualitatively explaine
d by a model of Koshelev et al., which was developed for conducting di
slocations. This signal is considered to be the evidence for electrica
l conductivity of grain boundaries at low temperatures (20 K).