HIGH-TEMPERATURE SCANNING TUNNELING MICROSCOPE WITH A NOVEL SAMPLE HEATER AND INTERCHANGEABLE SCAN HEADS

Authors
MCCANN LI SMALLEY RM DUBSON MA
Citation
Li. Mccann et al., HIGH-TEMPERATURE SCANNING TUNNELING MICROSCOPE WITH A NOVEL SAMPLE HEATER AND INTERCHANGEABLE SCAN HEADS, Review of scientific instruments, 65(8), 1994, pp. 2519-2522
Citations number
16
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
65
Issue
8
Year of publication
1994
Pages
2519 - 2522
Database
ISI
SICI code
0034-6748(1994)65:8<2519:HSTMWA>2.0.ZU;2-X
Abstract
A UHV-compatible, high-temperature scanning tunneling microscope (STM) with a sample stage incorporating a Si wafer as a resistive heater is described. The design allows for rapid interchange of scanning tubes so that the maximum scan size can be varied. The thermal stability of the microscope is excellent, allowing real-time studies of faceting an d grain growth of metal surfaces at temperatures up to 400 degrees C w ith a long term drift of similar to 0.05 Angstrom/s.