SCANNING NEARFIELD OPTICAL MICROSCOPE USING MICROFABRICATED PROBES

Authors
RADMACHER M HILLNER PE HANSMA PK
Citation
M. Radmacher et al., SCANNING NEARFIELD OPTICAL MICROSCOPE USING MICROFABRICATED PROBES, Review of scientific instruments, 65(8), 1994, pp. 2737-2738
Citations number
18
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
65
Issue
8
Year of publication
1994
Pages
2737 - 2738
Database
ISI
SICI code
0034-6748(1994)65:8<2737:SNOMUM>2.0.ZU;2-2
Abstract
Microfabricated tips, usually used for atomic force microscopy (AFM), can be modified and used in a scanning nearfield optical microscope. I nitial images show a resolution of about 80 nm (lambda/8) demonstratin g the quality and usefulness of these tips. They are mechanically stab le, potentially commercially available, and have high light transmissi bility. Furthermore, they can be easily combined with an atomic force microscope to give simultaneous nearfield optical and AFM images.