ADHESION STUDIES OF SPUTTERED ALUMINUM FILMS ON XC-70 STEEL SUBSTRATES - EFFECTS OF THE APPLICATION OF A BIAS VOLTAGE ON THE SUBSTRATE DURING DEPOSITION
A. Lahmar et M. Cailler, ADHESION STUDIES OF SPUTTERED ALUMINUM FILMS ON XC-70 STEEL SUBSTRATES - EFFECTS OF THE APPLICATION OF A BIAS VOLTAGE ON THE SUBSTRATE DURING DEPOSITION, Thin solid films, 248(2), 1994, pp. 204-211
The adhesion strength of sputtered aluminium films to XC 70 steel subs
trates has been studied using the scratch adhesion test. The influence
of the application of a bias voltage on the substrate during depositi
on was investigated by means of a mean critical load derived from a We
ibull-like statistical analysis. It was found that in the absence of b
ias, the interface is rather abrupt, while the interface obtained with
the application of a bias voltage is much more diffuse. We can consid
er that the widening of the interfacial region offers a better film an
chorage on its substrate, requiring a stylus load value clearly excess
ively high to produce an adhesion failure.