TEMPERATURE AND INCIDENT BEAM-CURRENT DEPENDENCE OF DOMINANT FREE-EXCITON RECOMBINATION RADIATION FROM HIGH-PURITY CHEMICAL-VAPOR-DEPOSITION (CVD) DIAMONDS
A. Yamaguchi et al., TEMPERATURE AND INCIDENT BEAM-CURRENT DEPENDENCE OF DOMINANT FREE-EXCITON RECOMBINATION RADIATION FROM HIGH-PURITY CHEMICAL-VAPOR-DEPOSITION (CVD) DIAMONDS, JPN J A P 2, 33(8A), 1994, pp. 120001063-120001065
Dominant free-exciton (FE) recombination radiation has been obtained f
rom high-purity Chemical vapor deposition (CVD) diamond synthesized on
Cu substrates by means of microwave plasma CVD using CH4+O2 diluted w
ith H-2. The intensity of FE emission is almost constant between 80 K
and 170 K, and is reduced by two orders of magnitude at room temperatu
re. The emission increases in proportion to the incident beam current
from 1 x 10(-9) A to 2 x 10(-6) A. The spectrum shapes between 200 nm
and 600 nm do not depend on the beam current. In addition, the isotopi
c effect on the FE emission peak shift has been observed in the spectr
um from C-13-enriched (96.6%) CVD diamond for the first time.