ELASTIC AND VIBRATIONAL PROPERTIES OF PSEUDOMORPHIC FESI FILMS

Citation
H. Vonkanel et al., ELASTIC AND VIBRATIONAL PROPERTIES OF PSEUDOMORPHIC FESI FILMS, Physical review. B, Condensed matter, 50(6), 1994, pp. 3570-3576
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
50
Issue
6
Year of publication
1994
Pages
3570 - 3576
Database
ISI
SICI code
0163-1829(1994)50:6<3570:EAVPOP>2.0.ZU;2-7
Abstract
We analyze the structural, vibrational, and elastic properties of epit axial novel FeSi films on Si(111) in the CsCl structure by Rutherford- backscattering spectrometry, x-ray-diffraction, infrared transmittance /reflectance, and Brillouin-light-scattering measurements. By comparin g our results for different film thicknesses and by interpreting them on the basis of semiempirical total-energy calculations, we are able t o relate the changes in vibrational properties with the progressive st rain relaxation as a function of sample thickness. For the thickest fi lm (890 angstrom) we obtain indications that a structural transition t o the (bulk) epsilon phase is about to take place.