DETERMINATION OF ACOUSTIC PARAMETERS OF THIN-LAYERS AND FILMS FROM ELECTRICAL CHARACTERISTICS OF A COMPOUND RESONATOR

Citation
Bn. Krutov et al., DETERMINATION OF ACOUSTIC PARAMETERS OF THIN-LAYERS AND FILMS FROM ELECTRICAL CHARACTERISTICS OF A COMPOUND RESONATOR, Acoustical physics, 40(4), 1994, pp. 562-566
Citations number
11
Categorie Soggetti
Acoustics
Journal title
ISSN journal
10637710
Volume
40
Issue
4
Year of publication
1994
Pages
562 - 566
Database
ISI
SICI code
1063-7710(1994)40:4<562:DOAPOT>2.0.ZU;2-H
Abstract
A technique for measuring absorption and velocity of bulk acoustic wav es in solids is developed and verified. The technique is based on a co mpound acoustic resonator, which includes a layer or thin film of a su bstance to be investigated. It relies on measurement and analysis of f requency dependences of the amplitude and phase of electromagnetic wav e reflection by an acoustic resonator, and it allows one to measure ab sorbance ranging from a fraction of a decibel to several hundred decib els per centimeter, accurate to 10(-2). Acoustic wave velocities can b e measured to an accuracy of 10(-4).