SCANNING NEAR-FIELD OPTICAL MICROSCOPY

Authors
HEINZELMANN H POHL DW
Citation
H. Heinzelmann et Dw. Pohl, SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Applied physics. A, Solids and surfaces, 59(2), 1994, pp. 89-101
Citations number
119
Categorie Soggetti
Physics, Applied
Journal title
Applied physics. A, Solids and surfaces → ACNP
ISSN journal
07217250
Volume
59
Issue
2
Year of publication
1994
Pages
89 - 101
Database
ISI
SICI code
0721-7250(1994)59:2<89:SNOM>2.0.ZU;2-Q
Abstract
Scanning Near-field Optical Microscopy (SNOM) allows the investigation of optical properties on subwavelength scales. During the past few ye ars, more and more attention has been given to this technique that sho ws enormous potential for imaging, sensing and modification at near-mo lecular resolution. This article describes the technique and reviews r ecent progress in the field.