The step structure and terrace distribution of Si(001) vicinal surface
s has been studied by profile analysis of the (00) spot and by measuri
ng superstructure spot intensities using high-resolution LEED on a len
s-shaped sample. In the [110] azimuth, the transition from single laye
r (S-) steps at low miscut angle gamma to double layer (D-) steps occu
rs continuously between about 2-degrees and 6-degrees. Beyond 11-degre
es, (115) facets are admixed. While the surface in the range 5-degrees
less-than-or-equal-to gamma less-than-or-equal-to 7.5-degrees in all
azimuths is built up by (001) terraces separated by steps, an increasi
ng disorder of the edge pattern is deduced when leaving the [110] azim
uth. In the range where the surface in the [110] azimuth is not yet si
ngle-domain (gamma = 5-degrees), this decrease starts at a deviation o
f about +/-10-degrees from the [110] azimuth, for gamma = 6-degrees an
d 7.5-degrees, the intensity decreases immediately. In the [100] azimu
th, the existence of long-range ordered S-steps with broad terrace wid
th distribution is deduced from the data.