G. Polisski et al., CONTROL OF SILICON NANOCRYSTALLITE SHAPE ASYMMETRY AND ORIENTATION ANISOTROPY BY LIGHT-ASSISTED ANODIZATION, Applied physics letters, 70(9), 1997, pp. 1116-1118
It is shown that the different and conflicting results on the strength
of polarization memory effect on porous Si result from the influence
of light on the electrochemical etching process. Illumination in gener
al reduces the memory effect by decreasing the particle shape asymmetr
y. Linearly polarized light can both enhance or reduce the effect. It
is accompanied by an in-plane orientation anisotropy of the memory par
ameter for (100) porous Si. This effect is evidence for a preferential
alignment of the crystallite asymmetry axis normal to the light polar
ization. (C) 1997 Institute of Physics.