INTRINSIC CARRIER CAPTURE TIME IN DEEP-ETCHED QUANTUM-BOX (70 NM DIAMETER) LASERS AT LOW-TEMPERATURE - AN INDICATION OF EXTREMELY HIGH QUANTUM CAPTURE EFFICIENCY
J. Wang et al., INTRINSIC CARRIER CAPTURE TIME IN DEEP-ETCHED QUANTUM-BOX (70 NM DIAMETER) LASERS AT LOW-TEMPERATURE - AN INDICATION OF EXTREMELY HIGH QUANTUM CAPTURE EFFICIENCY, Applied physics letters, 70(9), 1997, pp. 1152-1154
In this letter we report the measurement result of intrinsic carrier c
apture time in deep-etched quantum-box (70 nm diameter) lasers at low
temperature (2 and 77 K). In order to investigate intrinsic carrier ca
pture and relaxation mechanism, we have to rule out the contribution o
f the geometry factor and derive the local quantum capture time, For t
his purpose. lasers with the same box size (70 nm) but different box d
ensities, that are arranged as two-dimensional periodic arrays for dis
tributed feedback operations are prepared and measured. We find that t
he quantum capture time of the box lasers determined at 2 and 77 K is
only about 2.4 ps and is smaller than the corresponding value of the q
uantum-well lasers, This is a direct experimental indication of the ex
istence of an efficient channel for carrier capture and relaxation in
the quantum-box system investigated. (C) 1997 American Institute of Ph
ysics.