X-RAY-FLUORESCENCE ESCAPE PEAKS IN HGI2 DETECTORS

Authors
LIUXU X HEITZ C SIFFERT P REGAL R
Citation
X. Liuxu et al., X-RAY-FLUORESCENCE ESCAPE PEAKS IN HGI2 DETECTORS, X-ray spectrometry, 23(4), 1994, pp. 178-182
Citations number
12
Categorie Soggetti
Spectroscopy
Journal title
X-ray spectrometry → ACNP
ISSN journal
00498246
Volume
23
Issue
4
Year of publication
1994
Pages
178 - 182
Database
ISI
SICI code
0049-8246(1994)23:4<178:XEPIHD>2.0.ZU;2-L
Abstract
A mathematical model for the estimation of the relative intensities of the escape peaks in HgI2 detectors is presented. Comparison of calcul ated results with experimental values for various x-ray shows satisfac tory agreement. The method can be used to evaluate directly the sensit ive thickness of an HgI2 detector through the escape to total peak int ensity ratio.