EXPECTED CONTRIBUTION OF THE FIELD-EMISSION GUN TO HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

Authors
ZEMLIN F
Citation
F. Zemlin, EXPECTED CONTRIBUTION OF THE FIELD-EMISSION GUN TO HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Micron, 25(3), 1994, pp. 223-226
Citations number
17
Categorie Soggetti
Microscopy
Journal title
Micron → ACNP
ISSN journal
09684328
Volume
25
Issue
3
Year of publication
1994
Pages
223 - 226
Database
ISI
SICI code
0968-4328(1994)25:3<223:ECOTFG>2.0.ZU;2-E