The influence of pulsed bias light excitation on the absorption in the
defect region of undoped a-Si:H film has been investigated. Ac consta
nt photocurrent method has been used to measure the absorption spectru
m. The absorption in the defect region increases with the light pulse
duration.The analysis of obtained results does not support the existen
ce of a long time relaxation process of dangling-bond states in a-Si:H
.