OXYGEN INCORPORATION IN POLYETHYLENE IMPLANTED WITH 150KEV SB+ IONS

Samples of polyethylene (PE) loaded with carbon black up to 8 wt.% and implanted with 150 keV Sb+ ions to the doses from 2 x 10(13)-2 x 10(1 5) cm-2 were studied using standard Rutherford Back Scattering (RBS) t echnique. On the PE samples implanted to the doses above 2 X 10(14) cm -2, a considerable surface carbonization is observed. The measured par ameters of the Sb depth profile are compared with theoretical TRIM est imations. The projected range is by 25 % lower than the theoretical on e and the range straggling is about twice of that predicted. The diffe rences are explained by stepwise polymer degradation during the ion bo mbardment. Strong oxidation of the ion implanted polymers is also obse rved. The oxygen depth profiles from the sample surface up to the dept h comparable with Sb+ ion range evolve from nearly uniform one for low ion doses to highly non-uniform one for doses above 1 x 10(15) cm-2. The total oxygen content in the sample surface layer 300 nm thick reac hes a maximum for the doses of (1-2) x 10(14) cm-2.