Rc. Albers et al., ELECTRONIC-STRUCTURE AND X-RAY PHOTOELECTRON-SPECTROSCOPY OF THE ALPHA-PHASE, BETA-PHASE, AND GAMMA-PHASE OF NP, Physical review. B, Condensed matter, 54(20), 1996, pp. 14405-14412
The electronic structure, density of states, and x-ray photoelectron s
pectroscopy (XPS) intensities of the alpha, beta, and gamma phases of
Np have been theoretically determined from self-consistent, fully rela
tivistic, linear muffin-tin-orbital band-structure calculations. The c
alculated XPS intensities show a large f peak that narrows (due to the
larger volumes per atom) and moves closer to the Fermi energy as one
progresses through the alpha, beta, and gamma phases. Experimental XPS
intensities of the alpha and beta phases are also presented and compa
red to the theoretical calculations. Experimentally, the alpha and bet
a intensities are found to be almost identical, and do not show any ev
idence for the theoretically predicted f-band narrowing. In addition,
there is a large additional experimental intensity at higher binding e
nergy that is not present in the calculations. This extra intensity ma
y be evidence for quasilocalized behavior of the 5f electronic states
that is induced by the XPS process. For example, the low-energy tail m
ay be related to either multiplet or satellite structure due to final-
state localized atomiclike correlation effects.