ELECTRONIC STOPPING POWER MEASUREMENTS USING SECONDARY-ION BEAMS

Stopping powers for O and Ti ions were measured in a mylar foil 2 mum thick. The choice of the foil was made because of its wide application in elastic recoil detection analysis experiments and thin windows for gaseous detectors. As a new approach, recoil ions produced in heavy i on scattering were utilized for (dE/dx) measurements. The energy loss of the recoil ions was measured by keeping two surface barrier detecto rs, with and without the mylar foil, at the same recoil angle, with th eir gains matched with pulsers before the experiment. Different energi es of the secondary beam could be selected by changing the detection a ngle. Also, various species of secondary ions could be obtained by mer ely changing the target. We demonstrate here our new technique and som e of the results obtained.