STRUCTURAL AND ELECTRICAL-PROPERTIES OF A METALLIC ROUGH-THIN-FILM SYSTEM DEPOSITED ON LIQUID SUBSTRATES

Citation
Gx. Ye et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF A METALLIC ROUGH-THIN-FILM SYSTEM DEPOSITED ON LIQUID SUBSTRATES, Physical review. B, Condensed matter, 54(20), 1996, pp. 14754-14757
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
54
Issue
20
Year of publication
1996
Pages
14754 - 14757
Database
ISI
SICI code
0163-1829(1996)54:20<14754:SAEOAM>2.0.ZU;2-W
Abstract
A rough-thin-him system, deposited on silicone oil drop surfaces by a rf-magnetron sputtering method, has been fabricated and its structure as well as I-V characteristics have been studied. A characteristic sur face morphology at the micrometer scale is observed. The anomalous dep osition rate, which strongly depends on the nominal film thickness, ca n be interpreted under the assumption of the second evaporating and th e penetrating effects. We find I-c proportional to R(0)(-alpha), with alpha=0.521-0.06, where R(0) and I-c are the zero power resistance and the breakdown current, respectively. The importance of the liquid sub strates is discussed.