Gx. Ye et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF A METALLIC ROUGH-THIN-FILM SYSTEM DEPOSITED ON LIQUID SUBSTRATES, Physical review. B, Condensed matter, 54(20), 1996, pp. 14754-14757
A rough-thin-him system, deposited on silicone oil drop surfaces by a
rf-magnetron sputtering method, has been fabricated and its structure
as well as I-V characteristics have been studied. A characteristic sur
face morphology at the micrometer scale is observed. The anomalous dep
osition rate, which strongly depends on the nominal film thickness, ca
n be interpreted under the assumption of the second evaporating and th
e penetrating effects. We find I-c proportional to R(0)(-alpha), with
alpha=0.521-0.06, where R(0) and I-c are the zero power resistance and
the breakdown current, respectively. The importance of the liquid sub
strates is discussed.