We first discuss the work on strain and critical thickness of large ar
ea lattice mismatched epilayers of GeSi, InGaAs and II-VI semiconducto
rs. A summary of Finite Element (FE) calculations of stresses in strip
e-substrate heterostructures is then given. Calculated stresses for no
vel stripe designs are also given. The results are then applied to int
erpret experiments. Raman and luminescence experiments on stripes of G
aAs/Si GeSi/Si and InGaAs/GaAs, Raman experiments on LOGOS structures
and on GeSi quantum wires and quantum dots and luminescence experiment
s on InGaAs quantum wires are included in the discussion.