UNIFIED NOISE MOSFET MODELING

In this paper we present unified models for the main noise contributio ns of the MOSFET drain current spectral density: the flicker noise and the thermal noise. The new noise model is consistent with a unified d rain current model. All equations present an infinite order of continu ity through all operating regimes. This makes the model very useful to study the noise in analog circuits, especially in low-power applicati ons.