A modified RSD algorithm has been implemented in a switched-current pi
pelined A/D converter. The offset insensitivity of the RSD converter r
educes the effect of several nonidealities proper to current copier ce
lls. Moreover, the benefits resulting from the large tolerances inhere
nt to the RSD algorithm and the pipelined architecture result in an im
proved conversion rate. Measurements on a first prototype give an inte
gral nonlinearity error less than 0.8 LSB for 10-bit accuracy. Power d
issipation is 20 mW and silicon area is 2.5 mm2. The measured sampling
rate is 550 kS/s. It is an improvement by a factor-of twenty compared
to known equivalent CMOS switched-current converters. It is neverthel
ess still well below the predicted conversion rate of 4.5 MHz, which s
hould be obtained once this A/D converter is integrated into an analog
front-end. Full compatibility with standard digital technologies make
s this kind of converter attractive for low power, medium-fast convert
ers with 10-bit accuracy.