Ion implantation and the associated annealing was investigated using l
uminescence and absorption measurements to demonstrate the efficacy of
implantation for introducing various classes of dopants into GaN. A w
ide range of implantation and annealing studies were performed with se
veral dopant species (Zn, Nd, Er, Ar). Room temperature ion implantati
on was performed on MOCVD grown GaN samples at energies between 200 an
d 400 keV with doses ranging from 1 x 10(13) to 1 x 10(15) cm(-2). Con
ventional furnace annealing in flowing NH3 or N-2 resulted in good rec
overy of implantation damage at an annealing temperature of 1000 degre
es C for 90 min. However, surface degradation became evident for annea
ling in an NH3 environment at temperatures above 1000 degrees C. Low t
emperature photoluminescence showed that the optical activation of the
Zn, and the rare earth elements, Er and Nd, was optimum in the NH3 an
nealing environment at 1000 degrees C.