IMAGING WITH ION-BEAMS AND LASER POSTIONIZATION

Citation
M. Wood et al., IMAGING WITH ION-BEAMS AND LASER POSTIONIZATION, Analytical chemistry, 66(15), 1994, pp. 2425-2432
Citations number
30
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032700
Volume
66
Issue
15
Year of publication
1994
Pages
2425 - 2432
Database
ISI
SICI code
0003-2700(1994)66:15<2425:IWIALP>2.0.ZU;2-6
Abstract
We investigate the use of a liquid metal ion gun (LMIG) combined with multiphoton resonance ionization of sputtered atoms and/or molecules t o acquire mass-selected images with submicrometer spatial resolution. Images from several model systems are presented including those of an In grid, and of patterned surfaces of benzo[a]pyrene and tryptophan th in films. Since postionization for these systems yields ionization eff iciencies that are considerably higher than those achieved with second ary ion mass spectrometry (SIMS), spatial resolution of 2600 Angstrom for molecular species could be achieved while static conditions were m aintained. Cooling of the sample to <210 K was shown to be essential f or molecular systems since the number of thermally evaporating molecul es overwhelms the number of sputtered molecules at room temperature. O ther details necessary to incorporate laser postionization into a time -of-flight SIMS instrument using a pulsed LMIG source are also discuss ed.