D. Li et al., X-RAY-ABSORPTION SPECTROSCOPY OF SILICON DIOXIDE (SIO2) POLYMORPHS - THE STRUCTURAL CHARACTERIZATION OF OPAL, The American mineralogist, 79(7-8), 1994, pp. 622-632
SiK- and SiL-edge X-ray absorption spectra obtained using synchrotron
radiation are reported for 6:3-coordinated stishovite and 4:2-coordina
ted alpha quartz, alpha cristobalite, coesite, amorphous silica (a-SiO
2), and opal. The SiK and SiL near-edge features are interpreted on th
e basis of a qualitative MO model of SiO44- and SCF-Xalpha calculation
of model molecules. Some edge features are attributed to the multiple
scattering effect of the more distant shell atoms in the crystal stru
cture. The K- and L-edge features reflect the maximum densities of uno
ccupied Si 3s, 3p, and 3d states in the conduction band and are qualit
atively in agreement with calculated densities of states. Comparison o
f SiK- and SiL-edge XANES demonstrates the bond mixing of Si 3p and 3s
orbitals and of Si 3p and 3d orbitals. Also, for 4:2-coordinated sili
ca, the transition of Si 2p electrons to the t2 State Of high Si 3p ch
aracter becomes dipole allowed. For stishovite and coesite, states dom
inated by Si 3s apparently have a large amount of Si 3p orbital charac
ter, probably because of pressure-induced mixing of Si 3s and 3p orbit
als. The SiK- and SiL-edge shifts are systematically related to the co
ordination number of Si atoms, Si-O bond length, Si-Si distance, Si-O-
Si angle, Si-O bond valence, and Si NMR chemical shift of SiO2 polymor
phs. The SiK- and SiL-edge XANES indicate that the local structure of
two opals investigated is a mixture of a-SiO2 and alpha cristobalite s
tructural units, and the relative proportions of the two structural co
mponents are semiquantitatively determined. EXAFS structure parameters
(bond distances, coordination number, and Debye-Waller factor) of qua
rtz and stishovite are obtained and shown to be in good agreement with
the X-ray structures. Si in sixfold and fourfold coordination can be
distinguished unambiguously from SiK- and SiL-edge XANES features and
SiK-edge EXAFS analysis. These results are very useful for characteriz
ing the structure and bonding of the mantle silicates and silicate gla
sses.