QUALITY AND RELIABILITY - ELECTRICAL DEFECTS

Most reliability information is statistical, destructive and only avai lable after some period of time. For electronic devices, low-level ele ctrical measurements can provide a measure of the deviations of the de vice properties from the ideal, and hence its quality. These measureme nts also act as non-destructive, predictive reliability indicators on each sample. The range of such measurements described include leakage and electrical noise, but here most emphasis is placed on time-depende nt or transient effects due to traps.