USE OF SCANNING-TUNNELING-MICROSCOPY IN METALLOGRAPHY

Citation
Jj. Wang et al., USE OF SCANNING-TUNNELING-MICROSCOPY IN METALLOGRAPHY, Materials characterization, 33(2), 1994, pp. 169-174
Citations number
13
Categorie Soggetti
Materials Science, Characterization & Testing
Journal title
ISSN journal
10445803
Volume
33
Issue
2
Year of publication
1994
Pages
169 - 174
Database
ISI
SICI code
1044-5803(1994)33:2<169:UOSIM>2.0.ZU;2-W
Abstract
Scanning tunneling microscopy was used for the first time to study the bainitic microstructure of an austempered Fe-1.0C-4.0Cr-2.0Si alloy w hen certain experimental procedures were taken to minimize surface abs orption and oxidation. Specimen preparation methods and observation pr ocedures required for the study of easily oxidized materials by scanni ng tunneling microscopy, and the interpretation of the scanning tunnel ing image, including microstructural contrast, phase morphologies, etc ., are discussed. The results demonstrate that scanning tunneling micr oscopy, which is used mainly in studying special materials, such as pu re gold, single crystal silicon, etc., is another powerful metallograp hic tool.