Mmb. Holl et al., CORE-LEVEL PHOTOEMISSION AND THE STRUCTURE OF THE SI SIO2 INTERFACE -A REAPPRAISAL/, Applied physics letters, 65(9), 1994, pp. 1097-1099
Photoemission spectroscopy of spherosiloxane cluster derived Si/SiO(x)
interfaces has allowed the direct assignment of observed spectral fea
tures to specific chemical moieties. The implications of these assignm
ents for structural models of the Si/SiO2 interface are explored. Mode
ls specifically constructed to be consistent with photoemission data a
re shown to be incorrect after reanalysis of core-level shifts based o
n the recently synthesized model systems. A new model for the Si/SiO2
interface is proposed which is consistent with the current understandi
ng of photoemission for Si/SiO(x) interfaces as well as with results f
rom numerous other experiments.