CHARGE INJECTION DEVICE (CID) TECHNOLOGY - A SOLUTION FOR PHOTON AND PARTICLE IMAGING APPLICATIONS

Charge Injection Device (CID) imagers provide key electro-optical perf ormance features and versatile readout capabilities for spatial and ra diometric measurements of photon and particle radiation. CIDs have man y of the performance features required for machine vision and scientif ic applications including good resolution, broad spectral response, re sistance to blooming and asynchronous operation for feature detection and measurement. Single pixel imaging devices and two-dimensional arra ys possess exceptionally large pixel charge capacities and wide dynami c range that provide quantum (shot-noise) limited operation. Commercia l devices have demonstrated the robustness and capability to operate i n hostile (including ionizing radiation) environments. Recently-develo ped CID imagers and camera systems have incorporated new on-chip archi tectures and process technology that provide low-noise performance and permit exploitation of additional features including random-pixel add ressability, true non-destructive pixel readout (NDRO), and two-dimens ional windowing (subarray readout). These CID features allow scientist s to monitor and adapt application exposure in real time, reduce noise , and read out small pixel subarrays at fast rates. CID imagers posses s structural characteristics and improved radiation tolerance (approxi mately 10(6) gamma) which allow these devices to operate in harsh radi oactive environments and image different forms of radiation including X-rays, electron beams and nuclear radiation.