CHARACTERIZATION OF CCD-BASED IMAGING X-RAY-DETECTORS FOR DIFFRACTIONEXPERIMENTS

High-resolution CCD-based imaging detectors are successfully used in X -ray diffraction experiments. some detectors are commercially availabl e, others have been developed by research groups around the world. Rel iable comparison of the performance must be based on thorough testing of all relevant characteristics of these detectors. We describe method s of measurements of detector parameters such as conversion gain, line arity, uniformity, point spread function, geometrical uniformity, dark current, and detective quantum efficiency. As an example for the char acterization, test results of a single module fiberoptic taper/CCD X-r ay detector will be presented. The projected performance of a large ar ea, array detector consisting of 9 CCDs and fiberoptic taper modules, will be given. This new detector (the ''Gold'' detector) will be insta lled on Beamline X8C at the National Synchrotron Light Source at Brook haven National Laboratory.