THE ADVANCED PHOTON SOURCE-X-RAY TRANSMITTING BEAM-POSITION-MONITOR TESTS AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE X-25 BEAMLINE

Citation
D. Shu et al., THE ADVANCED PHOTON SOURCE-X-RAY TRANSMITTING BEAM-POSITION-MONITOR TESTS AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE X-25 BEAMLINE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 577-580
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
347
Issue
1-3
Year of publication
1994
Pages
577 - 580
Database
ISI
SICI code
0168-9002(1994)347:1-3<577:TAPSTB>2.0.ZU;2-T
Abstract
A synthetic-diamond-based X-ray transmitting beam-position monitor has been studied using focused white beam at the National Synchrotron Lig ht Source X-25 wiggler beamline. of particular interest are the possib ilities to design an integral window and filter/photon beam-position m onitor for the Advanced Photon Source high-heat-flux insertion-device beamlines. The preliminary measurements were taken using two synthetic -diamond blade samples with different thicknesses and cooling configur ations. The monitor (consisting of a vacuum vessel, an ion pump, a wat er-cooling base, a blade mounting block, and electric feedthroughs) wa s mounted on a three-dimensional (x, y, phi) stepping-motor-driven sta ge with a 0.064-mum stepping size and a 0.1-mum linear encoder resolut ion. An infrared camera system was used to monitor and record the diam ond blade surface temperature field through a sapphire window and test results are presented.