N. Badi et al., VALENCE AND CONDUCTION BAND-EDGES-CHARGE DENSITIES IN GA1-XALXP MIXED-CRYSTALS, Materials chemistry and physics, 38(3), 1994, pp. 243-249
The empirical pseudopotential method (EPM) combined with the virtual c
rystal approximation ''VCA'' are used to compute electronic charge den
sities at GAMMA and X k-points of the valence and conduction band edge
s in the ternary GaAlP semiconductor alloy. These charge densities are
used to study the modifications of the bonding and electronic propert
ies of the alloy with respect to the molar fraction of Al in GaP.