Ch. Tsau et Jw. Yeh, THE COARSENING OF SILICON PARTICLES IN A SUBMICRON-GRAINED LAYER-DEPOSITED AL-12WT-PERCENT-SI ALLOY, Materials chemistry and physics, 38(3), 1994, pp. 258-266
A submicron-grained Al-12wt%Si alloy with a uniform distribution of fi
ne silicon particles was produced by a layer-deposition process and su
bsequent hot working. The grain structure was characterized by high an
gle grain boundaries with a random spectrum of orientation. The averag
e sizes of both grain and silicon particle were about 0.4mum in the as
-rolled state. The grain refinement came from the dynamic recrystalliz
ation on silicon particles. The grains did not show significant growth
in annealing even at 496-degrees-C for 24 hours, whereas silicon part
icles grew at a remarkable rate. The coarsening phenomenon of silicon
particles at elevated temperatures was studied systematically by annea
ling the specimens at 372-degrees-C, 433-degrees-C, 472-degrees-C and
493-degrees-C respectively for different periods. Results showed that
the volume of a silicon particle increased linearly with annealing tim
e. The activation energy for coarsening was calculated by Arrhenius eq
uation to be 54 kcal/mole which is almost triple the activation energy
for silicon diffusion in aluminium matrix. Because of the high energy
value, the coarsening should not be diffusion-controlled but interfac
e-controlled. In addition, the size distribution profile of silicon pa
rticles in aluminum matrix after annealing also accounts for the inter
face-controlled kinetics.