A multilevel solver for the circular contact was extended to elliptica
l contact problems. After verification of its predictions by compariso
n with results presented in literature, it was used to study the varia
tions of film thickness with varying operating conditions and aspect r
atio of the contact ellipse. Detailed computational results are presen
ted and observed tendencies are traced back to the modelling equations
. Subsequently it is demonstrated how and when, for contacts with the
entrainment directed perpendicular to the major principal axis of the
contact ellipse, the pressure and film thickness on the centre-line of
the contact can be predicted accurately from an equivalent line conta
ct analysis. Finally, survey graphs of the minimum and the central fil
m thickness are presented and a formula is given that predicts the cen
tral film thickness as a function of load and lubricant parameters, an
d the ratio of reduced radii of curvature of the surfaces. This formul
a incorporates asymptotic behaviour and as a result it can be applied
for all conditions. In particular, its accuracy for contacts with the
major principal axis of the contact ellipse perpendicular to the entra
ining direction is demonstrated in this paper.