ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY CONTRIBUTION TO ELUCIDATION OF THE MECHANISM OF CATHODIC DEPOSITION OF AS-SB ALLOYS

Citation
R. Bertoncello et al., ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY CONTRIBUTION TO ELUCIDATION OF THE MECHANISM OF CATHODIC DEPOSITION OF AS-SB ALLOYS, Journal of electroanalytical chemistry [1992], 374(1-2), 1994, pp. 37-43
Citations number
24
Categorie Soggetti
Electrochemistry,"Chemistry Analytical
Journal title
Journal of electroanalytical chemistry [1992]
ISSN journal
15726657 → ACNP
Volume
374
Issue
1-2
Year of publication
1994
Pages
37 - 43
Database
ISI
SICI code
Abstract
As-Sb alloys were deposited electrochemically onto flat, smooth Ni-pla ted Cu sheets from aqueous citric acid solutions and analysed by X-ray photoelectron spectroscopy (XPS) and angle-resolved (AR) XPS. Samples prepared and manipulated in air showed marked surface oxidation of bo th alloy elements, present as As2O3 and Sb2O3. Oxide-free samples were obtained when electrochemical synthesis and transfer to the ultrahigh vacuum XPS chamber were carried out in an inert atmosphere. ARXPS ana lysis of oxide-free alloy samples obtained at large negative potential showed an increase in intensity of the As(2p3/2) peak at grazing take off angles. This result, showing As surface enrichment, supports a pr eviously proposed kinetic model of As-Sb alloy electrodeposition.