Thermally Stimulated Luminescence (TSL) and phosphorescence measuremen
ts excited by X- and beta rays have been performed above room temperat
ure on fused quartz and on thin SiO2 films deposited on a silicon subs
trate by the technique of chemical vapour deposition. Although in thes
e types Of SiO2 the basic TSL features, noticeably the prominent glow
peak at 60 < T < 120-degrees-C, are similar to those already studied i
n quartz, some behaviours are different. Specifically, the maximum tem
perature of the glow peak shifts linearly to higher temperatures as a
consequence of partial pre-heating treatments and the phosphorescence
decay shows a t-1 power law. The implications of these results are dis
cussed also in comparison with the corresponding ones of crystalline q
uartz and with preliminary data on thermally stimulated currents measu
rements.