Gc. Eiden et Ns. Nogar, THE 2-PHOTON SPECTRUM OF IRON AND SILICON DETECTED BY RESONANT LASER-ABLATION, Chemical physics letters, 226(5-6), 1994, pp. 509-516
We report ionization spectra of Si and Fe atoms ablated at low fluence
from bulk Si and Re targets, respectively. Two-photon transition inte
nsities are calculated using second-order perturbation theory. We obta
in moderate agreement between experimental and calculated intensities,
assuming a temperature of 1100 +/- 200 K for Fe ablation from Re. Si
and Fe are detected in excited electronic states up to 1.9 and 1.5 eV,
respectively. Ablation of electronically excited Si is enhanced with
exposure to oxygen or water. This effect is compared with a similar ef
fect observed in ion induced sputtering of Si and other materials.