SECONDARY-ION MASS-SPECTROMETRY METHODOLOGY AND SURFACE-CHEMISTRY OF MIXED-OXIDE ELECTRODES - MODIFICATIONS INDUCED BY NOBLE-METAL CONTENT

Citation
S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY METHODOLOGY AND SURFACE-CHEMISTRY OF MIXED-OXIDE ELECTRODES - MODIFICATIONS INDUCED BY NOBLE-METAL CONTENT, Rapid communications in mass spectrometry, 8(8), 1994, pp. 659-665
Citations number
29
Categorie Soggetti
Spectroscopy,"Chemistry Analytical
ISSN journal
09514198
Volume
8
Issue
8
Year of publication
1994
Pages
659 - 665
Database
ISI
SICI code
0951-4198(1994)8:8<659:SMMASO>2.0.ZU;2-0
Abstract
Mixed-oxide coatings are extensively used in the electrochemical indus try. Secondary-ion mass spectrometric data confirm that technological research can indeed find a new way of controlling precursors, synthesi s conditions, purity of coatings and electrodic activity. Results obta ined by argon and oxygen primary-ion bombardment of RuO2/TiO2, IrO2/Ti O2, RuO2/IrO2/TiO2 films are reported. The presence of metal, metal ox ide and cluster ions suggests a more systematic use of secondary-ion m ass spectrometry in the elucidation of catalytic aspects. In-depth pro files of some ionic species and their correlation with parameters that induce significant modifications can help in the understanding of the solid state physics and inorganic chemistry involved.