We report the observation of fractal patterns in C60-tetracyanoquinodi
methane thin films. The fractal patterns and their microscopic feature
s are described and characterized. The fractal dimension was determine
d to be 1.69 +/- 0.07. According to the characterization results, the
observed fractals are compared to the cluster-diffusion-limited-aggreg
ation model. The growth of the fractal patterns in the thin films is a
lso in terms of the existing long-range correlation.