X-RAY-PHOTOEMISSION SPECTROSCOPY AND OPTICAL REFLECTIVITY OF YTTRIUM-STABILIZED ZIRCONIA

Citation
P. Camagni et al., X-RAY-PHOTOEMISSION SPECTROSCOPY AND OPTICAL REFLECTIVITY OF YTTRIUM-STABILIZED ZIRCONIA, Physical review. B, Condensed matter, 50(7), 1994, pp. 4292-4296
Citations number
16
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
50
Issue
7
Year of publication
1994
Pages
4292 - 4296
Database
ISI
SICI code
0163-1829(1994)50:7<4292:XSAORO>2.0.ZU;2-L
Abstract
X-ray-photoelectron spectroscopy (XPS) and optical measurements have b een performed to investigate the structure of electronic states in ytt rium-stabilized zirconia. From reflectivity observations, the spectral behavior of the dielectric function, of the energy loss, and of the e ffective electron number in the range 3-30 eV were obtained for single crystals with an yttria content of 12 and 24 mol%. This information, combined with binding-energy spectra from XPS, was used to infer the s tructure of valence and conduction states and to discuss the nature of the main optical transitions, also in connection with available theor etical data.