P. Camagni et al., X-RAY-PHOTOEMISSION SPECTROSCOPY AND OPTICAL REFLECTIVITY OF YTTRIUM-STABILIZED ZIRCONIA, Physical review. B, Condensed matter, 50(7), 1994, pp. 4292-4296
X-ray-photoelectron spectroscopy (XPS) and optical measurements have b
een performed to investigate the structure of electronic states in ytt
rium-stabilized zirconia. From reflectivity observations, the spectral
behavior of the dielectric function, of the energy loss, and of the e
ffective electron number in the range 3-30 eV were obtained for single
crystals with an yttria content of 12 and 24 mol%. This information,
combined with binding-energy spectra from XPS, was used to infer the s
tructure of valence and conduction states and to discuss the nature of
the main optical transitions, also in connection with available theor
etical data.