A METHOD FOR DETERMINATION OF MICROWAVE SURFACE IMPEDANCE OF HIGH-TC THICK-FILM AND BULK SUPERCONDUCTORS

Authors
WU ZP DAVIS LE
Citation
Zp. Wu et Le. Davis, A METHOD FOR DETERMINATION OF MICROWAVE SURFACE IMPEDANCE OF HIGH-TC THICK-FILM AND BULK SUPERCONDUCTORS, IEEE transactions on instrumentation and measurement, 43(4), 1994, pp. 532-535
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
Journal title
IEEE transactions on instrumentation and measurement → ACNP
ISSN journal
00189456
Volume
43
Issue
4
Year of publication
1994
Pages
532 - 535
Database
ISI
SICI code
0018-9456(1994)43:4<532:AMFDOM>2.0.ZU;2-H
Abstract
A resonator method is presented which enables R(s) and X(s) to be dete rmined as a function of temperature with the exclusion of the thermal expansion effect. Results for R(s) and X(s) are given for a bulk YBCO sample at 13 GHz over the range 15-190 K. Good agreement with the ''en hanced'' two-fluid model is found for lambda(T), and lambda = 657 nm a t 77 K.