RESOLUTION LIMITS OF MICROSCOPY THROUGH SCATTERING LAYERS

Authors
KEMPE M THON A RUDOLPH W
Citation
M. Kempe et al., RESOLUTION LIMITS OF MICROSCOPY THROUGH SCATTERING LAYERS, Optics communications, 110(5-6), 1994, pp. 492-496
Citations number
18
Categorie Soggetti
Optics
Journal title
Optics communications → ACNP
ISSN journal
00304018
Volume
110
Issue
5-6
Year of publication
1994
Pages
492 - 496
Database
ISI
SICI code
0030-4018(1994)110:5-6<492:RLOMTS>2.0.ZU;2-I
Abstract
The combination of confocal microscopy and suitable correlation method s with short light pulses is shown to enable imaging with micrometer r esolution through scattering media with potential applications in biol ogy and medicine. Experimental and theoretical investigations are pres ented describing fundamental limits of this imaging technique.