COPPER PHTHALOCYANINE FILM STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY

Authors
Citation
Dh. Gu et Qy. Chen, COPPER PHTHALOCYANINE FILM STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY, Optics communications, 110(5-6), 1994, pp. 576-580
Citations number
17
Categorie Soggetti
Optics
Journal title
ISSN journal
00304018
Volume
110
Issue
5-6
Year of publication
1994
Pages
576 - 580
Database
ISI
SICI code
0030-4018(1994)110:5-6<576:CPFSWS>2.0.ZU;2-A
Abstract
The ellipsometric spectra of vacuum sublimed copper phthalocyanine (Cu Pc) thin film on single-crystal silicon were studied on a new type of scanning ellipsometer with the analyser and polarizer rotate synchrono usly. The electronic structure of the spectra is discussed.