CHARACTERIZATION OF A PULSED X-RAY SOURCE FOR FLUORESCENT LIFETIME MEASUREMENTS

Citation
Sc. Blankespoor et al., CHARACTERIZATION OF A PULSED X-RAY SOURCE FOR FLUORESCENT LIFETIME MEASUREMENTS, IEEE transactions on nuclear science, 41(4), 1994, pp. 698-702
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
41
Issue
4
Year of publication
1994
Part
1
Pages
698 - 702
Database
ISI
SICI code
0018-9499(1994)41:4<698:COAPXS>2.0.ZU;2-O
Abstract
To search for new, fast, inorganic scintillators, we have developed a bench-top pulsed x-ray source for determining fluorescent lifetimes an d wavelengths of compounds in crystal or powdered form. This source us es a light-excited x-ray tube which produces x-rays when light from a laser diode strikes its photocathode. The x-ray tube has a tungsten an ode, a beryllium exit window, a 30 kV maximum tube bias, and a 50 muA maximum average cathode current. The laser produces 3x10(7) photons at 650 nm per approximately 100 ps pulse, with up to 10(7) pulses/sec. T he time spread for the laser diode, x-ray tube, and a microchannel pla te photomultiplier tube is less than 120 ps fwhm. The mean x-ray energ y at tube biases of 20, 25, and 30 kV is 9.4, 10.3, and 11.1 keV, resp ectively. We measured 140, 230, and 330 x-ray photons per laser diode pulse per steradian, at tube biases of 20, 25 and 30 kV, respectively. Background x-rays due to dark current occur at a rate of 1x10(6) and 3x10(6) photons/sec/steradian at biases of 25 and 30 kV, respectively. Data characterizing the x-ray output with an aluminum filter in the x -ray beam are also presented.