RECENT RESULTS FROM TEST OF FAST ANALOG-TO-DIGITAL CONVERTERS

We present results from tests of eight, ten, and twelve bit ADCs that operate in the range of 10 to 120 megasamples per second. We use a tes t bench and software we have developed to perform the tests on as wide a range of devices as possible. By testing devices with the same inpu t signals, the same software, and the same parameter definitions, we m ake possible direct comparisons between competing devices. Important p arameters measured include integral and differential nonlinearity, eff ective number of bits, and word error rate. While the tests are intend ed primarily to benefit the design of high rate physics experiments, t he results are also useful to workers in other fields.