APPLICATION OF FACTOR-ANALYSIS TO THE AUGER-ELECTRON SPECTROSCOPY STUDY OF YBA2CU3O7-X SUPERCONDUCTORS

In this paper factor analysis applied on AES measurements is used in t he study of the chemical composition of YBa2Cu3O7-x superconductors. I n the first part, YBa2Cu3O7-x thin films deposited on MgO and SrTiO3 a re investigated by AES depth profiling. Factor analysis makes it possi ble to identify secondary phases present at the surface and the interf aces. This method also offers the possibility of determining the real interface thickness, as the edges of pure film and pure substrate are more accurately defined. In the second part, the radiation induced eff ects of a 10 keV electron beam are investigated on YBa2Cu3O7-x single crystals. Besides the stoichiometric changes the chemical changes in f unction of the radiation dose are studied. Factor analysis indicates c lear peak changes throughout the irradiation process.